2014_2_3

Title of the article

THE INFLUENCE OF EXTERNAL DISTURBING FACTORS ON THE DURABILITY OF MICROWAVE DEVICES

Authors

Karapuzov Mikhail Aleksandrovich master, sub-department of information technologies and automated systems, Moscow institute of electronic and mathematic of National Research University «High School of Economics»
Polesskiy Sergey Nikolaevich candidate of technical scienses, associate professor, sub-department of information technologies and automated systems, Moscow institute of electronic and mathematic of National Research University «High School of Economics»
Zhadnov Valeriy Vladimirovich candidate of technical scienses, associate professor, sub-department of radio electronic and telecommunications, Moscow institute of electronic and mathematic of National Research University «High School of Economics»

Index UDK

621.3.029

Abstract

This article is about consideration must be given to durability’s indexes of SHF devices including mechanical parts. Only electronic parts of SHF devices are considered at evaluating reliability of whole device and mechanical parts are supposed reliable very much, almost failure-free. But mechanical parts may be exposed to effects of deterioration and destruction processesе, they are able to deform and change their material properties – flexibility, electroconductivity, magnet properties and etc. It shows interconnection of electronic and mechanical parts of SHF devices. Necessary to mention, that this interconnection is very difficult to describe. That’s why it so important to be able to properly evaluate reliability both mechanical and electronic parts and their durability. Ways of solving these problems are initiated in this article and described analysis of methods for evaluating reliability of mechanical parts.

Key words

reliability, durability, SHF devices, outside factors, useful life

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Дата создания: 06.04.2015 10:23
Дата обновления: 06.04.2015 10:23